IMECH-IR  > 力学所知识产出(1956-2008)
Optical fringe multiplication technique with TEM nano-moiré method
Xie HM; Liu ZW; Fang DN; Dai FL; Xing YM; Zhao YP(赵亚溥)
发表期刊Measurement Science & Technology
2005
卷号16期号:2页码:529-534
ISSN0957-0233
摘要In this paper, a nano-moiré fringe multiplication method is proposed, which can be used to measure nano-deformation of single crystal materials. The lattice structure of Si (111) is recorded on a film at a given magnification under a transmission microscope, which acts as a specimen grating. A parallel grating (binary type) on glass or film is selected as a reference grating. A multiplied nano-moiré fringe pattern can be reproduced in a 4f optical filter system with the specimen grating and the prepared reference grating. The successful results illustrate that this method can be used to measure deformation in nanometre scale. The method is especially useful in the measurement of the inhomogeneous displacement field, and can be utilized to characterize nano-mechanical behaviour of materials such as dislocation and atomic bond failure.
学科领域力学
DOI10.1088/0957-0233/16/2/027
收录类别SCI
语种英语
WOS记录号WOS:000227139700028
WOS研究方向Engineering ; Instruments & Instrumentation
WOS类目Engineering, Multidisciplinary ; Instruments & Instrumentation
引用统计
被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://dspace.imech.ac.cn/handle/311007/16674
专题力学所知识产出(1956-2008)
推荐引用方式
GB/T 7714
Xie HM,Liu ZW,Fang DN,et al. Optical fringe multiplication technique with TEM nano-moiré method[J]. Measurement Science & Technology,2005,16,2,:529-534.
APA Xie HM,Liu ZW,Fang DN,Dai FL,Xing YM,&赵亚溥.(2005).Optical fringe multiplication technique with TEM nano-moiré method.Measurement Science & Technology,16(2),529-534.
MLA Xie HM,et al."Optical fringe multiplication technique with TEM nano-moiré method".Measurement Science & Technology 16.2(2005):529-534.
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