The tension and compression of single-crystalline silicon nanowires (SiNWs) with different cross-sectional shapes are studied systematically using molecular dynamics simulation. The shape effects on the yield stresses are characterized. For the same surface to volume ratio, the circular cross-sectional SiNWs are stronger than the square cross-sectional ones under tensile loading, but reverse happens in compressive loading. With the atoms colored by least-squares atomic local shear strain, the deformation processes reveal that the failure modes of incipient yielding are dependent on the loading directions. The SiNWs under tensile loading slip in {111} surfaces, while the compressive loading leads the SiNWs to slip in the {110} surfaces. The present results are expected to contribute to the design of the silicon devices in nanosystems.
Yang ZY,Lu ZX,Zhao YP. Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation[J]. Journal of Applied Physics,2009,106,2,:023537.
APA
杨振宇,卢子兴,&赵亚溥.(2009).Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation.Journal of Applied Physics,106(2),023537.
MLA
杨振宇,et al."Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation".Journal of Applied Physics 106.2(2009):023537.
; Lu ZX(卢子兴)
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