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Surface plasmon resonance enhanced ellipsometric analysis for monitoring of cobalt electrochemical reaction in solution
Wang ZZ; Liu W(刘巍); Wang CX; Kan Q; Chen S(陈涉); Chen HD; Wang, CX (reprint author), Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Source PublicationSENSORS AND ACTUATORS B-CHEMICAL
2013-05-01
Volume181Pages:221-226
ISSN0925-4005
AbstractCobalt-based ion selective electrode (ISE) is one of the key methods for phosphate detection. In this paper, surface plasmon resonance (SPR) enhanced ellipsometric analysis method has been used to monitor the electrochemical reaction process at Co ISE sensor surface and the mass consumption of sensitive electrode membranes. An Au-Co bilayer film is designed as optical detection interface. In order to obtain detectable reflection intensity variation with Co thickness, Au film and Co film thickness are optimized at TM polarization state. According to the calculation results, 50 nm Au film is formed on glass substrate by electron beam evaporation. Then cobalt film with thickness of about 20 nm is grown on gold film by electrochemical deposition method. Ellipsometric measurements were performed at SPR angle 59. The consuming process of Co film reacting with dissolved oxygen in deionized water has been obtained by monitoring the change of reflection intensity.
KeywordSurface Plasmon Resonance Ellipsometry Ion Selective Electrode Image Contrast
Subject Area交叉与边缘领域的力学
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Indexed BySCI ; EI
Language英语
WOS IDWOS:000317941100032
Funding OrganizationNational Basic Research of China [2009CB320300, 2010CB934104, 2011CB933203, 2011CB933102]; Nation Natural Foundation of China [61036009, 60978067]
DepartmentLHD微尺度和非平衡流动
Classification二类/Q1
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Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/47259
Collection国家微重力实验室
Corresponding AuthorWang, CX (reprint author), Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Recommended Citation
GB/T 7714
Wang ZZ,Liu W,Wang CX,et al. Surface plasmon resonance enhanced ellipsometric analysis for monitoring of cobalt electrochemical reaction in solution[J]. SENSORS AND ACTUATORS B-CHEMICAL,2013,181:221-226.
APA Wang ZZ.,刘巍.,Wang CX.,Kan Q.,陈涉.,...&Wang, CX .(2013).Surface plasmon resonance enhanced ellipsometric analysis for monitoring of cobalt electrochemical reaction in solution.SENSORS AND ACTUATORS B-CHEMICAL,181,221-226.
MLA Wang ZZ,et al."Surface plasmon resonance enhanced ellipsometric analysis for monitoring of cobalt electrochemical reaction in solution".SENSORS AND ACTUATORS B-CHEMICAL 181(2013):221-226.
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