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An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers
Li R; Ye HF; Zhang WS; Ma GJ; Su YW(苏业旺); Li, R (reprint author), Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China.
Source PublicationSCIENTIFIC REPORTS
2015-10-29
Volume5Pages:15828
ISSN2045-2322
AbstractSpring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.
Subject Area基础力学
DOI10.1038/srep15828
URL查看原文
Indexed BySCI
Language英语
WOS IDWOS:000363625600001
WOS KeywordDEVICES
WOS Research AreaScience & Technology - Other Topics
WOS SubjectMultidisciplinary Sciences
Funding OrganizationThis work was supported by the National Natural Science Foundation of China (grants 11302038, 11572323 and 11302037) and Fundamental Research Funds for the Central Universities of China (grant DUT15LK14). Y.S. acknowledges the support from Chinese Academy of Sciences via the "Hundred Talent program".
DepartmentLNM苏业旺
Classification一类
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Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/58339
Collection非线性力学国家重点实验室
Corresponding AuthorLi, R (reprint author), Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China.
Recommended Citation
GB/T 7714
Li R,Ye HF,Zhang WS,et al. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers[J]. SCIENTIFIC REPORTS,2015,5:15828.
APA Li R,Ye HF,Zhang WS,Ma GJ,苏业旺,&Li, R .(2015).An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.SCIENTIFIC REPORTS,5,15828.
MLA Li R,et al."An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers".SCIENTIFIC REPORTS 5(2015):15828.
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