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Molecular Dynamics Simulation of Microcrack Healing in Copper
Li S; Gao KW; Qiao LJ; Zhou FX(周富信); Chu WY; Qiao, LJ (reprint author), Univ Sci & Technol Beijing, Dept Mat Phys, Beijing 100083, Peoples R China.
发表期刊COMPUTATIONAL MATERIALS SCIENCE
2001
卷号20期号:2页码:143-150
ISSN0927-0256
摘要The molecular dynamics method is used to simulate microcrack healing during heating or/and under compressive stress. A center microcrack in Cu crystal could be sealed under a compressive stress or by heating. The role of compressive stress and heating in crack healing was additive. During microcrack healing, dislocation generation and motion occurred. If there were pre-existed dislocations around the microcrack, the critical temperature or compressive stress necessary for microcrack healing would decrease, and the higher the number of dislocations, the lower the critical temperature or compressive stress. The critical temperature necessary for microcrack healing depended upon the orientation of crack plane. For example, the critical temperature of the crack along (001) plane was the lowest, i.e., 770 K. (C) 2001 Elsevier Science B.V. All rights reserved.
关键词Microcrack Healing Molecular Dynamics Simulation Dislocation Cu
DOI10.1016/S0927-0256(00)00130-0
收录类别SCI
语种英语
WOS记录号WOS:000166878500001
关键词[WOS]THIN-CRYSTALS ; CRACK-TIP ; NUCLEATION ; METALS
WOS研究方向Materials Science
WOS类目Materials Science, Multidisciplinary
引用统计
被引频次:14[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://dspace.imech.ac.cn/handle/311007/58487
专题力学所知识产出(1956-2008)
通讯作者Qiao, LJ (reprint author), Univ Sci & Technol Beijing, Dept Mat Phys, Beijing 100083, Peoples R China.
推荐引用方式
GB/T 7714
Li S,Gao KW,Qiao LJ,et al. Molecular Dynamics Simulation of Microcrack Healing in Copper[J]. COMPUTATIONAL MATERIALS SCIENCE,2001,20,2,:143-150.
APA Li S,Gao KW,Qiao LJ,周富信,Chu WY,&Qiao, LJ .(2001).Molecular Dynamics Simulation of Microcrack Healing in Copper.COMPUTATIONAL MATERIALS SCIENCE,20(2),143-150.
MLA Li S,et al."Molecular Dynamics Simulation of Microcrack Healing in Copper".COMPUTATIONAL MATERIALS SCIENCE 20.2(2001):143-150.
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