IMECH-IR  > 国家微重力实验室
Potential Modulation on Total Internal Reflection Ellipsometry
Liu W; Niu Y(牛宇); Viana AS; Correia JP; Jin G(靳刚); Jin, G (reprint author), Chinese Acad Sci, Inst Mech, NML, 15 Bei Si Huan West Rd, Beijing 100190, Peoples R China.
Source PublicationANALYTICAL CHEMISTRY
2016
Volume88Issue:6Pages:3211-3217
ISSN0003-2700
Abstract

Electrochemical-total internal reflection ellipsometry (EC-TIRE) has been proposed as a technique to observe the redox reactions on the electrode surface due to its high phase sensitivity to the electrolyte/electrode interface. In this paper, we mainly focus on the influence of the potential modulation on the TIRE response. The analysis suggests that both dielectric constant variation of gold and the electric double layer transformation would modulate the reflection polarization of the surface. For a nonfaradaic process, the signal of TIRE would be proportional to the potential modulation. To testify the analysis, linear sweep voltammetry and open circuit measurement have been performed. The results strongly support the system analysis.

DOI10.1021/acs.analchem.5b04587
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Indexed BySCI
Language英语
WOS IDWOS:000372391500033
WOS Research AreaChemistry
WOS SubjectChemistry, Analytical
Funding OrganizationThe authors thank the financial support to the International Science & Technology Cooperation Program of China (Grant 2015DFG32390), to the seventh Sino-Portugal Scientific and Technological Cooperation of 2013-2015, to the National Basic Research Program of China (Grant 2015CB352100), to the National Natural Science Foundation of China (Grants 21305147 and 81472941), the Portuguese Foundation for Science and Technology, FCT (Projects IF/00808/2013/CP1159/CT0003 and UID/MULTI/00612/2013), POPH and UE, and FSE, Yantai Science and Technology Development Fund (2012128).
DepartmentNML纳米生物光学
Classification一类
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Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/59520
Collection国家微重力实验室
Corresponding AuthorJin, G (reprint author), Chinese Acad Sci, Inst Mech, NML, 15 Bei Si Huan West Rd, Beijing 100190, Peoples R China.
Recommended Citation
GB/T 7714
Liu W,Niu Y,Viana AS,et al. Potential Modulation on Total Internal Reflection Ellipsometry[J]. ANALYTICAL CHEMISTRY,2016,88(6):3211-3217.
APA Liu W,Niu Y,Viana AS,Correia JP,Jin G,&Jin, G .(2016).Potential Modulation on Total Internal Reflection Ellipsometry.ANALYTICAL CHEMISTRY,88(6),3211-3217.
MLA Liu W,et al."Potential Modulation on Total Internal Reflection Ellipsometry".ANALYTICAL CHEMISTRY 88.6(2016):3211-3217.
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