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纹影测量成像系统及方法
戴国亮; 孙志斌; 代斌; 王静
2017-01-11
Rights Holder中国科学院力学研究所
Abstract一种纹影测量成像系统和方法,该系统包括光源,用于输出光信号;以及沿所述光源输出光信号路径依次设置的第一聚焦透镜、狭缝光阑、第一准直透镜、流场观测区域、第二聚焦透镜、刀口、第二准直透镜、数字微阵列反射镜、汇聚透镜和单点光电探测器;压缩算法模块,其与单点光电探测器电信号连接,用于重构图像,通过对图像的纹影计算方法计算出观测流场的结构分布。本发明将压缩感知理论与纹影测量相结合,创造性的提出稀疏纹影测量方法,具有高通量、高信噪比、快速灵活的特点,适宜于常规光强、弱光、微弱光、超微弱光和单光子纹影测量方式,是一种大动态范围的稀疏纹影测量方法。
Application Date2014-02-27
Date Available2017-01-11
Patent NumberZL201410068835.0
Language中文
Country中国
Document Type专利
Identifierhttp://dspace.imech.ac.cn/handle/311007/59876
Collection国家微重力实验室
Recommended Citation
GB/T 7714
戴国亮,孙志斌,代斌,等. 纹影测量成像系统及方法. ZL201410068835.0[P]. 2017-01-11.
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