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Title:
Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution
Author: Yang L; Chen HS; Jiang HQ; Wei YJ(魏宇杰); Song WL; Fang DN(方岱宁)
Source: CHEMICAL COMMUNICATIONS
Issued Date: 2018-04-18
Volume: 54, Issue:32, Pages:3997-4000
English Abstract: An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.
Language: 英语
Indexed Type: SCI
DOI: 10.1039/c7cc09708e
DOC Type: Article
WOS Subject: Chemistry, Multidisciplinary
WOS Subject Extended: Chemistry
WOS Keyword Plus: LITHIUM-ION BATTERIES ; FINITE-ELEMENT-ANALYSIS ; THIN-FILM ; POTENTIOSTATIC OPERATION ; CHEMICAL-EQUILIBRIUM ; RIGID SUBSTRATE ; ELECTRODES ; STRESS ; LITHIATION ; INSERTION
WOS ID: WOS:000435250100018
ISSN: 1359-7345
Funder: National Natural Science Foundation of China(11672341 ; 973 Project(2015CB932500) ; Foundation for Innovative Research Groups of the National Natural Science Foundation of China(11521202) ; National Materials Genome Project(2016YFB0700600) ; Beijing Natural Science Foundation(16L00001) ; 111572002 ; 51302011)
Classification: 二类/Q1
Ranking: 4
Citation statistics:
Content Type: 期刊论文
URI: http://dspace.imech.ac.cn/handle/311007/77513
Appears in Collections:非线性力学国家重点实验室_期刊论文

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Recommended Citation:
Yang L,Chen HS,Jiang HQ,et al. Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution[J]. CHEMICAL COMMUNICATIONS,2018-04-18,54(32):3997-4000.
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