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An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films
Zhang Y(张吟); Gao FF(高斐斐); Zheng ZY; Cheng ZH
发表期刊ACTA MECHANICA SINICA
2018-12-01
卷号34期号:6页码:1061-1071
ISSN0567-7718
摘要In an indentation test, the effective Young's modulus of a film/substrate bilayer heterostructure varies with the indentation depth, a phenomenon known as the substrate effect. In previous studies investigating this, only the Young's modulus of the film was unknown. Once the effective Young's modulus of a film/substrate structure is determined at a given contact depth, the Young's modulus of the film can be uniquely determined, i.e., there is a one-to-one relation between the Young's modulus of the film and the film/substrate effective Young's modulus. However, at times it is extremely challenging or even impossible to measure the film thickness. Furthermore, the precise definition of the layer/film thickness for a two-dimensional material can be problematic. In the current study, therefore, the thickness of the film and its Young's modulus are treated as two unknowns that must be determined. Unlike the case with one unknown, there are infinite combinations of film thickness and Young's modulus which can yield the same effective Young's modulus for the film/substrate. An inverse problem is formulated and solved to extract the Young's modulus and thickness of the film from the indentation depth-load curve. The accuracy and robustness of the inverse problem-solving method are also demonstrated.
关键词Indentation test Film Substrate Inverse problem
DOI10.1007/s10409-018-0778-8
URL查看原文
收录类别SCI ; EI
语种英语
WOS记录号WOS:000450715600005
关键词[WOS]ELASTIC-MODULUS ; MECHANICAL-PROPERTIES ; ADHESION MAP ; THIN-LAYERS ; CONTACT ; SUBSTRATE ; HARDNESS ; STIFFNESS ; FRICTION ; GRAPHENE
WOS研究方向Engineering, Mechanical ; Mechanics
WOS类目Engineering ; Mechanics
项目资助者National Natural Science Foundation of China [11772335, 21622304, 61674045, 21203038] ; Ministry of Science and Technology (MOST) of China [2016YFA0200700] ; Distinguished Technical Talents Project ; Youth Innovation Promotion Association of Chinese Academy of Sciences
论文分区二类
力学所作者排名1
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文献类型期刊论文
条目标识符http://dspace.imech.ac.cn/handle/311007/78142
专题非线性力学国家重点实验室
作者单位1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China
2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China
3.Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China
4.Renmin Univ China, Beijing Key Lab Optoelect Funct Mat & Micronano D, Beijing 100872, Peoples R China
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Zhang Y,Gao FF,Zheng ZY,et al. An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films[J]. ACTA MECHANICA SINICA,2018,34(6):1061-1071.
APA 张吟,高斐斐,Zheng ZY,&Cheng ZH.(2018).An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films.ACTA MECHANICA SINICA,34(6),1061-1071.
MLA 张吟,et al."An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films".ACTA MECHANICA SINICA 34.6(2018):1061-1071.
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