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An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films
Zhang Y(张吟); Gao FF(高斐斐); Zheng ZY; Cheng ZH
Source PublicationACTA MECHANICA SINICA
2018-12-01
Volume34Issue:6Pages:1061-1071
ISSN0567-7718
Abstract

In an indentation test, the effective Young's modulus of a film/substrate bilayer heterostructure varies with the indentation depth, a phenomenon known as the substrate effect. In previous studies investigating this, only the Young's modulus of the film was unknown. Once the effective Young's modulus of a film/substrate structure is determined at a given contact depth, the Young's modulus of the film can be uniquely determined, i.e., there is a one-to-one relation between the Young's modulus of the film and the film/substrate effective Young's modulus. However, at times it is extremely challenging or even impossible to measure the film thickness. Furthermore, the precise definition of the layer/film thickness for a two-dimensional material can be problematic. In the current study, therefore, the thickness of the film and its Young's modulus are treated as two unknowns that must be determined. Unlike the case with one unknown, there are infinite combinations of film thickness and Young's modulus which can yield the same effective Young's modulus for the film/substrate. An inverse problem is formulated and solved to extract the Young's modulus and thickness of the film from the indentation depth-load curve. The accuracy and robustness of the inverse problem-solving method are also demonstrated.

KeywordIndentation test Film Substrate Inverse problem
DOI10.1007/s10409-018-0778-8
URL查看原文
Indexed BySCI ; EI
Language英语
WOS IDWOS:000450715600005
WOS KeywordELASTIC-MODULUS ; MECHANICAL-PROPERTIES ; ADHESION MAP ; THIN-LAYERS ; CONTACT ; SUBSTRATE ; HARDNESS ; STIFFNESS ; FRICTION ; GRAPHENE
WOS Research AreaEngineering, Mechanical ; Mechanics
WOS SubjectEngineering ; Mechanics
Funding OrganizationNational Natural Science Foundation of China [11772335, 21622304, 61674045, 21203038] ; Ministry of Science and Technology (MOST) of China [2016YFA0200700] ; Distinguished Technical Talents Project ; Youth Innovation Promotion Association of Chinese Academy of Sciences
CSCD IDCSCD:6403531
Classification二类
Ranking1
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Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/78142
Collection非线性力学国家重点实验室
Affiliation1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China
2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China
3.Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China
4.Renmin Univ China, Beijing Key Lab Optoelect Funct Mat & Micronano D, Beijing 100872, Peoples R China
Recommended Citation
GB/T 7714
Zhang Y,Gao FF,Zheng ZY,et al. An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films[J]. ACTA MECHANICA SINICA,2018,34(6):1061-1071
APA Zhang Y,Gao FF,Zheng ZY,&Cheng ZH.(2018).An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films.ACTA MECHANICA SINICA,34(6),1061-1071.
MLA Zhang Y,et al."An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films".ACTA MECHANICA SINICA 34.6(2018):1061-1071.
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