IMECH-IR  > 非线性力学国家重点实验室
An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes
Chen J1; Yang L2; Han Y1; Bao YH3; Zhang KL1; Li X4; Pang J4; Chen HS1; Song WL1; Wei YJ(魏宇杰)5; Fang DN1,3
Corresponding AuthorYang, Le(yangle@tsinghua.edu.cn) ; Chen, Hao-Sen(chenhs@bit.edu.cn)
Source PublicationJOURNAL OF POWER SOURCES
2019-12-31
Volume444Pages:5
ISSN0378-7753
AbstractHere an in situ system is presented to simultaneously study the evolution of both morphology and stress in the silicon thin film electrode during lithiation and delithiation. Owing to the specific design with two observation windows in the in situ cell, both the curvature and color of the silicon thin-film electrodes upon lithiation and delithiation processes can be measured by multi-optical sensor and optical microscope. By such colorimetric method, the color evolution can be used to represent the thickness of silicon thin film electrode, and the quantitative relationship can be obtained by in situ atomic force microscope and optical microscopy experiments. Combining the real thickness with Stoney equation, the accurate stress of the LixSi film can be obtained during the electrochemical cycles.
KeywordLithium ion batteries Silicon film Multi-beam optical sensor (MOS) in situ stress measurement Colorimetric method
DOI10.1016/j.jpowsour.2019.227227
Indexed BySCI ; EI
Language英语
WOS IDWOS:000501401900007
WOS KeywordLITHIUM-ION BATTERIES ; ELECTROCHEMICAL LITHIATION ; FRACTURE ENERGY ; EVOLUTION ; LI ; INTERPHASE
WOS Research AreaChemistry ; Electrochemistry ; Energy & Fuels ; Materials Science
WOS SubjectChemistry, Physical ; Electrochemistry ; Energy & Fuels ; Materials Science, Multidisciplinary
Funding ProjectNational Natural Science Foundation of China[11672341] ; National Natural Science Foundation of China[11572002] ; National Key Research and Development Program of China[2018YFB0104400] ; Innovative Research Groups of the National Natural Science Foundation of China[11521202] ; National Materials Genome Project[2016YFB0700600] ; State Key Laboratory of Explosion Science and Technology[ZDKT18-03] ; Beijing Natural Science Foundation[16L00001] ; Beijing Natural Science Foundation[2182065]
Funding OrganizationNational Natural Science Foundation of China ; National Key Research and Development Program of China ; Innovative Research Groups of the National Natural Science Foundation of China ; National Materials Genome Project ; State Key Laboratory of Explosion Science and Technology ; Beijing Natural Science Foundation
Classification一类
Ranking5+
ContributorYang, Le ; Chen, Hao-Sen
Citation statistics
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/81215
Collection非线性力学国家重点实验室
Affiliation1.Beijing Inst Technol, Inst Adv Struct Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China;
2.Tsinghua Univ, AML, CNMM, Dept Engn Mech, Beijing 100084, Peoples R China;
3.Peking Univ, Coll Engn, State Key Lab Turbulence & Complex Syst, Beijing 100871, Peoples R China;
4.China Automot Battery Res Inst Co Ltd, Beijing 100088, Peoples R China;
5.Chinese Acad Sci, Inst Mech, LNM, Beijing 100190, Peoples R China
Recommended Citation
GB/T 7714
Chen J,Yang L,Han Y,et al. An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes[J]. JOURNAL OF POWER SOURCES,2019,444:5.
APA Chen J.,Yang L.,Han Y.,Bao YH.,Zhang KL.,...&Fang DN.(2019).An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes.JOURNAL OF POWER SOURCES,444,5.
MLA Chen J,et al."An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes".JOURNAL OF POWER SOURCES 444(2019):5.
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