IMECH-IR
当前检索式 ((ALL:Atomic Force Microscopy))
限定条件 ((收录类别:SCI) AND (作者:311007-001099))
共16条,第1-16条
Journal of Applied P 2 ACTA MECHANICA SINIC 1 AIP ADVANCES 1
Chaos, Solitons & Fr 1 INTERNATIONAL JOURNA 1 INTERNATIONAL JOURNA 1
JOURNAL OF PHYSICS D 1 JOURNAL OF SOUND AND 1 Journal of Adhesion 1
Journal of Applied M 1 Journal of Micromech 1 Journal of Sound and 1
SENSORS 1 Sensors (Basel) 1 Sensors and Actuator 1
Sensors and Actuator 1