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Hysteresis effect in adhesive elastic contact 会议论文
2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference, Chicago, IL, United states, September 2, 2003 - September 6, 2003
Authors:  Wei Z(魏征);  Zhao YP(赵亚溥)
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Scanning Probe Microscope (Spm)  Transition Parameter