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中国科学院力学研究所机构知识库
Knowledge Management System of Institue of Mechanics, CAS
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力学所知识产出(19... [4]
Creator
Li YL [4]
reprint au... [4]
陈诺夫 [4]
Yang SY [3]
Chen CL [2]
Liu LF [2]
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2004 [4]
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SCI [4]
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Indexed By:SCI
Date Issued:2004
Document Type:期刊论文
Community:力学所知识产出(1956-2008)
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Properties of high k gate dielectric gadolinium oxide deposited on Si(100) by dual ion beam deposition (DIBD)
期刊论文
Journal of Crystal Growth, 2004, 卷号: 270, 期号: 1-2, 页码: 21-29
Authors:
Zhou JP
;
Chai CL
;
Yang SY
;
Liu ZK
;
Song SL
;
Li YL
;
Chen NF(陈诺夫)
;
Zhou, JP (reprint author), Tsing Hua Univ, Dept Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China.
Adobe PDF(461Kb)
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View/Download:723/178
  |  
Submit date:2009/08/03
Auger Electron Spectroscopy
Atomic Force Microscopy
Crystal Structures
X-ray Photoelectron Spectroscopy
Ion-beam Deposition
Oxides
4d Photoemission
High-resolution
Thin-films
Silicon
System
Gd2o3
Y2o3
Mn implanted GaAs by low energy ion beam deposition
期刊论文
Journal of Crystal Growth, 2004, 卷号: 264, 期号: 1-3, 页码: 31-35
Authors:
Song SL
;
Chen NF(陈诺夫)
;
Zhou JP
;
Yin ZG
;
Li YL
;
Yang SY
;
Liu ZK
;
Song, SL (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China.
Adobe PDF(297Kb)
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View/Download:651/144
  |  
Submit date:2009/08/03
X-ray Diffraction
Ion Beam Deposit
Magnetic Materials
Semiconducting Gallium Arsenide
Curie-temperature
Semiconductors
Ferromagnetism
System
Mn)As
(Ga
Gan
Magnetic Properties of Mn-Implanted n-Type Ge
期刊论文
Journal of Crystal Growth, 2004, 卷号: 273, 期号: 1-2, 页码: 106-110
Authors:
Liu LF
;
Chen NF(陈诺夫)
;
Chen CL
;
Li YL
;
Yin ZG
;
Yang F
;
Liu, LF (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 100083, Peoples R China.
Adobe PDF(200Kb)
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View/Download:889/199
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Submit date:2007/06/15
FexSi grown with mass-analyzed low-energy dual ion beam deposition
期刊论文
Journal of Crystal Growth, 2004, 卷号: 263, 期号: 1-4, 页码: 143-147
Authors:
Liu LF
;
Chen NF(陈诺夫)
;
Zhang FQ(张富强)
;
Chen CL
;
Li YL
;
Yang SY
;
Liu Z
;
Liu, LF (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China.
Adobe PDF(224Kb)
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  |  
View/Download:627/146
  |  
Submit date:2009/08/03
Auger Electron Spectroscopy
X-ray Diffraction
Ion Beam depositIon
Semiconducting Silicon
Doped Si-mn
Spin-photonics
Thin-films
Silicon
Gas