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Toughness Of Ni/Al2O3 Interfaces As Dependent On Micron-Scale Plasticity And Atomistic-Scale Separation 期刊论文
Philosophical Magazine, 2008, 卷号: 88, 期号: 30-32, 页码: 3841-3859
Authors:  Wei YG(魏悦广);  Hutchinson JW;  Hutchinson, JW (reprint author), Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA.
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