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Linear off null working condition for total internal reflection imaging ellipsometry to detect subtle electron density change 会议论文
1st Optics Frontier Conference 2021, Hangzhou, 24 April 2021 到 26 April 2021
Authors:  Jin X;  Wang C;  Shen J;  Liu W(刘巍);  Luo ZR(罗子人);  Niu Y(牛宇)
Adobe PDF(396Kb)  |  Favorite  |  View/Download:227/72  |  Submit date:2021/11/30
Electron density  TIRIE  Working conditions  
Dual photometric-conductometric detector for microfluidic chip 会议论文
International Conference on Experimental Mechanics 2008, ICEM 2008, Nanjing, China, November 8, 2008 - November 8, 2008
Authors:  Shen F(申峰);  Yu Y(于泳);  Kang Q(康琦);  Shen, F.
View  |  Adobe PDF(1253Kb)  |  Favorite  |  View/Download:191/63  |  Submit date:2017/07/14
Analytes  Capacitively Coupled Contactless Conductivity Detection  Conductometrics  Detection Cells  Dual-detectors  Electrokinetic  Inorganic Ions  Lab-on-a-chip  Laser Induced Fluorescence  Microfluidic Chip  Rhodamine b  Separation Efficiency