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Multi-Scale Characterizations for Ductile Thin Film Delamination 会议论文
IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales, MAY 31-JUN 04, 2004 Hong Kong Univ Sci & Technol, Hong Kong, PEOPLES R CHINA
作者:  Wei YG(魏悦广);  Xu GS
Adobe PDF(295Kb)  |  收藏  |  浏览/下载：633/201  |  提交时间：2007/12/18
Size effect characterization for nanostructured material in nanoindentation test 会议论文
Symposium on Continuous Nanophase and Nanostructured Materials held at the 2003 MRS Fall Meeting, Boston, MA, DEC 01-05, 2003
作者:  Wei YG(魏悦广);  Du Y;  Shu SQ;  Zhu C;  Wei, YG (reprint author), Chinese Acad Sci, Inst Mech, LNM, Beijing 100080, Peoples R China.
浏览  |  Adobe PDF(834Kb)  |  收藏  |  浏览/下载：155/69  |  提交时间：2016/06/30