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An integrated approach for structural damage identification using wavelet neuro-fuzzy model 期刊论文
EXPERT SYSTEMS WITH APPLICATIONS, 2013, 卷号: 40, 期号: 18, 页码: 7415-7427
作者:  Zhu FT;  Deng ZM;  Zhang JF(张均锋);  Deng, ZM (reprint author), Beijing Univ Aeronaut & Astronaut, Sch Astronaut, 37 XueYuan Rd, Beijing 100191, Peoples R China.
Adobe PDF(3044Kb)  |  收藏  |  浏览/下载：828/305  |  提交时间：2013/11/18
Signal Processing Approach  Structural Damage Identification  Wavelet Real-time Filtering Algorithm  Adaptive Neuro-fuzzy Inference System  Interval Modeling Technique  
A statistical analytical method for fatigue reliability containing very-high-cycle fatigue regime 会议论文
International Conference on Airworthiness ＆ Fatigue-7th ICSAELS Series Conference, 中国北京/Beijing, China, 2013-03-25
作者:  Sun CQ(孙成奇);  Zhang XL;  Xie JJ(谢季佳);  Hong YS(洪友士)
浏览  |  Adobe PDF(231Kb)  |  收藏  |  浏览/下载：438/204  |  提交时间：2014/04/02
Very-high-cycle Fatigue  Fatigue Life  Reliability  P-s-n Curve  
First-passage time of Duffing oscillator under combined harmonic and white-noise excitations 期刊论文
Nonlinear Dynamics, 2003, 卷号: 32, 期号: 3, 页码: 291-305
作者:  Zhu WQ(朱位秋);  Wu YJ;  Zhu, WQ (reprint author), Zhejiang Univ, Dept Mech, Hangzhou 310027, Peoples R China.
Adobe PDF(176Kb)  |  收藏  |  浏览/下载：629/149  |  提交时间：2009/08/03
Duffing Oscillator  Combined Harmonic And White Noise Excitations  Stochastic Averaging  First-passage Time  Reliability  Integrable-hamiltonian-systems  Nonlinear Oscillators  Passage Time  Broad-band  Failure  Envelope  
Effects of Underfill's Filling Situation on the Reliability of Flip-chip Packages 会议论文
Fourth International Symposium on Electronic Packaging Technology, 北京/Beijing, China, 2001-8-8
作者:  Wang HY(汪海英);  Wang JJ(王建军);  Liu S;  Zhao YP(赵亚溥)
Adobe PDF(691Kb)  |  收藏  |  浏览/下载：335/82  |  提交时间：2014/02/14
Solder  Underfill  Filled  0  Outmost  Substrate  0  Fatigue  Package  Understand  Joints  Thermal  Lives  0  Silicon  Reliability  Range  0  Different  Smaller  Corners  Studied  Assumed  Simulation