IMECH-IR

Browse/Search Results:  1-1 of 1 Help

Filters    
Selected(0)Clear Items/Page:    Sort:
An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes 期刊论文
JOURNAL OF POWER SOURCES, 2019, 卷号: 444, 页码: 5
Authors:  Chen J;  Yang L;  Han Y;  Bao YH;  Zhang KL;  Li X;  Pang J;  Chen HS;  Song WL;  Wei YJ(魏宇杰);  Fang DN
View  |  Adobe PDF(774Kb)  |  Favorite  |  View/Download:104/37  |  Submit date:2020/03/11
Lithium ion batteries  Silicon film  Multi-beam optical sensor (MOS)  in situ stress measurement  Colorimetric method