Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force

doi:10.1007/s004190100194

IMECH-IR > 力学所知识产出(1956-2008)

	Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force
	Zhao YP(赵亚溥); Zhao, YP (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China.
发表期刊	Archive of Applied Mechanics
	2002
卷号	72 期号:1 页码:77-84
ISSN	0939-1533
摘要	The morphological stability of epitaxial thin elastic films on a substrate by van der Waals force is discussed. It is found that only van der Waals force with negative Hamaker constant (A < 0) tends to stabilize the film, and the lower bound for the Hamaker constant is also obtained for the stability of thin film. The critical value of the undulation wavelength is found to be a function of both film thickness and external stress. The charateristic time-scale for surface mass diffusion scales to the fourth power to the wavelength of the perturbation.
学科领域	力学
DOI	10.1007/s004190100194
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000173782600005
WOS研究方向	Mechanics
WOS类目	Mechanics
引用统计	被引频次：17[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://dspace.imech.ac.cn/handle/311007/16779
专题	力学所知识产出(1956-2008)
通讯作者	Zhao, YP (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100080, Peoples R China.
推荐引用方式 GB/T 7714	Zhao YP,Zhao, YP . Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force[J]. Archive of Applied Mechanics,2002,72,1,:77-84.
APA	赵亚溥,&Zhao, YP .(2002).Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force.Archive of Applied Mechanics,72(1),77-84.
MLA	赵亚溥,et al."Morphological Stability of Epitaxial Thin Elastic Films by Van Der Waals Force".Archive of Applied Mechanics 72.1(2002):77-84.

条目包含的文件		下载所有文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
ja321.pdf（121KB）			开放获取	--	浏览下载