IMECH-IR  > 力学所知识产出(1956-2008)
微尺度位移、形貌测量系统及应用
Alternative TitleDevelopment of Micro-scale Displacement and Profile Measurement Systemand its Applications
缪泓; 张泰华; 郇勇; 伍小平
Source Publication实验力学
2007-08-15
Volume22Issue:3/4Pages:424-428
Abstract研制了一套可应用于MEMS器件的微尺度测量系统,可以在受载状态下实时检测MEMS器件的面内位移、离面位移和三维形貌.该系统中,面内位移测量是一个基于白光数字散斑相关方法的显微光学测量系统,与相应的力学加载系统结合,可以得到MEMS器件在受载状态下的实时面内位移;离面位移和三维形貌测量则是一个基于相移显微投影光栅方法的光学测量系统,与相应的力学加载系统结合,可以得到MEMS器件在受载状态下的实时三维形貌和离面位移.最后给出了几个典型的MEMS器件面内位移、离面位移和三维形貌的实测结果.
Keyword微尺度测量 数字散斑相关 投影条纹 相移 Mems
Indexed ByCSCD
Language中文
CSCD IDCSCD:2950099
Citation statistics
Cited Times:2[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/41182
Collection力学所知识产出(1956-2008)
Corresponding Author缪泓
Recommended Citation
GB/T 7714
缪泓,张泰华,郇勇,等. 微尺度位移、形貌测量系统及应用[J]. 实验力学,2007,22,3/4,:424-428.
APA 缪泓,张泰华,郇勇,&伍小平.(2007).微尺度位移、形貌测量系统及应用.实验力学,22(3/4),424-428.
MLA 缪泓,et al."微尺度位移、形貌测量系统及应用".实验力学 22.3/4(2007):424-428.
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