Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors

doi:10.1002/aelm.202000618

IMECH-IR > 非线性力学国家重点实验室

	Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors
	Li S(李爽)1,2; Liu GD(刘国栋)1,2; Wang LW 3; Fang GH 3; Su YW(苏业旺)1,2,4
通讯作者	Su, Yewang(yewangsu@imech.ac.cn)
发表期刊	ADVANCED ELECTRONIC MATERIALS
	2020-09-13
页码	6
ISSN	2199-160X
摘要	Stretchable strain sensors have recently attracted great attention due to their extensive applications in advanced devices. Plenty of work has been devoted to enlarging the gauge factor (GF) (reaching as high as 10(7)), since the conventional wisdom holds that a high GF indicates a low limit of detection and a high resolution of a sensor. Here, the effects of the GF on the measurement accuracy is investigated for resistive-type strain sensors, via the basic approach based on Ohm's law and the commonly used method of Wheatstone bridge, respectively. It is found that a bigger GF is not always better for improvement of the measurement accuracy, which is contrary to conventional wisdom. Overlarge gauge factor yields a large measuring error for resistive-type stretchable strain sensors (reaching the measuring error of 50% for GF = 5 x 10(4)under a typical measurement condition). This finding is of much significance for providing theoretical guidance for the sensor design and avoid more efforts on overlarge GF.
关键词	gauge factor stretchable strain sensors wearable electronics
DOI	10.1002/aelm.202000618
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000568703400001
关键词[WOS]	SKIN
WOS研究方向	Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目	Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
资助项目	National Natural Science Foundation of China[11772331] ; National Natural Science Foundation of China[11572323] ; Beijing Municipal Science and Technology Commission[Z191100002019010] ; Beijing Municipal Natural Science Foundation[2202066] ; Key Research Program of Frontier Sciences Chinese Academy of Sciences[ZDBS-LY-JSC014] ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences[XDB22040501] ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology[GZ19102]
项目资助者	National Natural Science Foundation of China ; Beijing Municipal Science and Technology Commission ; Beijing Municipal Natural Science Foundation ; Key Research Program of Frontier Sciences Chinese Academy of Sciences ; Chinese Academy of Sciences via the Hundred Talent Program ; Strategic Priority Research Program of the Chinese Academy of Sciences ; Beijing Institute of Space Mechanics Electricity ; State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology
论文分区	二类/Q1
力学所作者排名	1
RpAuthor	Su, Yewang
引用统计	被引频次：12[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://dspace.imech.ac.cn/handle/311007/85202
专题	非线性力学国家重点实验室
作者单位	1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China; 2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China; 3.Beijing Inst Space Mech & Elect, Beijing 100094, Peoples R China; 4.Dalian Univ Technol, Dept Engn Mech, State Key Lab Struct Anal Ind Equipment, Dalian 116024, Peoples R China
推荐引用方式 GB/T 7714	Li S,Liu GD,Wang LW,et al. Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors[J]. ADVANCED ELECTRONIC MATERIALS,2020:6.
APA	李爽,刘国栋,Wang LW,Fang GH,&苏业旺.(2020).Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors.ADVANCED ELECTRONIC MATERIALS,6.
MLA	李爽,et al."Overlarge Gauge Factor Yields a Large Measuring Error for Resistive-Type Stretchable Strain Sensors".ADVANCED ELECTRONIC MATERIALS (2020):6.

条目包含的文件		下载所有文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
Jp2020361.pdf（1145KB）	期刊论文	出版稿	开放获取	CC BY-NC-SA	浏览下载