IMECH-IR  > 微重力重点实验室
SINGLE ION DETECTION METHOD AND DEVICE
Liu W(刘巍);  Niu Y(牛宇);  Luo ZR(罗子人)
2023-11-07
专利权人中国科学院力学研究所
摘要A single ion imaging-based detection method and device areprovided. After being reflected by an electromodulationsingularity coupling differential imaging reaction unit,aprobe beam from a total internal reflection ellipsometryimager converges on a CCD or CMOS detector, the acquiredsensing surface image data is transmitted to a signal pro-cessing unit, the common mode noise is eliminated byperforming spectral analysis on differential signals of aworking sensing surface and a reference sensing surface, thepeak intensity of a modulating signal is selected on thespectrum for wave filtering to obtain a real-time signal ofinteraction of single ions or charged molecules at a solid-liquid interface. Based on the singularity effect at a surfaceplasma resonance angle of an ellipsometry phase and acorresponding optical signal noise suppression scheme, thepresent application can achieve real-time observation of theadsorption of single ions or charged molecules at a solidsurface.
申请日期2022-03-22
授权日期2023-11-07
专利号US 11808695
语种英语
专利类型国际发明专利
文献类型专利
条目标识符http://dspace.imech.ac.cn/handle/311007/93941
专题微重力重点实验室
推荐引用方式
GB/T 7714
刘巍;牛宇;罗子人. SINGLE ION DETECTION METHOD AND DEVICE. US 11808695[P]. 2023-11-07.
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