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Linear off null working condition for total internal reflection imaging ellipsometry to detect subtle electron density change 会议论文
1st Optics Frontier Conference 2021, Hangzhou, 24 April 2021 到 26 April 2021
Authors:  Jin X;  Wang C;  Shen J;  Liu W(刘巍);  Luo ZR(罗子人);  Niu Y(牛宇)
Adobe PDF(396Kb)  |  Favorite  |  View/Download：219/67  |  Submit date：2021/11/30
Electron density  TIRIE  Working conditions  
Development of biosensor based on imaging ellipsometry and biomedical applications 期刊论文
Thin Solid Films, 2011, 卷号: 519, 期号: 9, 页码: 2750-2757
Authors:  Jin G(靳刚);  Meng YH(孟永宏);  Liu L(刘丽);  Niu Y(牛宇);  Chen S(陈涉);  Cai Q;  Jiang TJ;  Jin, G (reprint author), Chinese Acad Sci, NML, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China
Adobe PDF(870Kb)  |  Favorite  |  View/Download：832/201  |  Submit date：2012/04/01
Imaging Ellipsometry  Biosensor  Protein Microarray  Total Internal Reflection  Off-null Ellipsometry  Optical Protein-chip  Optimization  Visualization  
Development of biosensor based on imaging ellipsometry and biomedical applications 会议论文
5th International Conference on Spectroscopic Ellipsometry, Albany, NY, MAY 23-29, 2010
Authors:  Jin G(靳刚);  Meng YH(孟永宏);  Liu L(刘丽);  Niu Y(牛宇);  Chen S(陈涉);  Cai Q;  Jiang TJ;  Jin, G (reprint author), Chinese Acad Sci, NML, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China
Adobe PDF(870Kb)  |  Favorite  |  View/Download：950/199  |  Submit date：2012/04/01
Imaging Ellipsometry  Biosensor  Protein Microarray  Total Internal Reflection  Off-null Ellipsometry  Optical Protein-chip  Optimization  Visualization  
Protein Microarray Biosensors Based on Imaging Ellipsometry Techniques and Their Applications 期刊论文
PROTEIN & CELL, 2011, 卷号: 2, 期号: 6, 页码: 445-455
Authors:  Niu Y(牛宇);  Jin G(靳刚);  Jin, G (reprint author), Chinese Acad Sci, Inst Mech, NML, Beijing 100190, Peoples R China.
View  |  Adobe PDF(569Kb)  |  Favorite  |  View/Download：192/74  |  Submit date：2016/02/01
Biosensor  Protein Microarray  Imaging Ellipsometry  Total Internal Reflection Imaging Ellipsometry  Applications