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In-situ SEM investigation on fatigue behaviors of additive manufactured Al-Si10-Mg alloy at elevated temperature 期刊论文
ENGINEERING FRACTURE MECHANICS, 2019, 卷号: 214, 页码: 149-163
Authors:  Wang Z;  Wu WW;  Qian GA(钱桂安);  Sun LJ(孙立娟);  Li XD;  Correia JFO
View  |  Adobe PDF(6276Kb)  |  Favorite  |  View/Download：320/78  |  Submit date：2019/11/27
In-situ SEM  Fatigue  Crack propagation  High temperature  Computer tomography  
Alternating-current induced thermal fatigue of gold interconnects with nanometer-scale thickness and width 期刊论文
Review of Scientific Instruments, 2011, 卷号: 82, 期号: 10, 页码: 103903
Authors:  Sun LJ;  Ling X;  Li XD;  Li, XD (reprint author), Tsinghua Univ, CNMM, AML, Dept Engn Mech, Beijing 100084, Peoples R China
Adobe PDF(1739Kb)  |  Favorite  |  View/Download：890/224  |  Submit date：2012/04/01
Cu Interconnects  Damage  Electromigration  Metallization  Frequency  Mechanism  Failure  Lines  Films