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The plasma electrolytic oxidation micro-discharge channel model and its microstructure characteristic based on Ti tracer 会议论文
5th Asian International Conference on Heat Treatment and Surface Engineering, Hangzhou, PEOPLES R CHINA, NOV 12-14, 2016
作者:  Gao FY(高方圆);  Hao L(郝丽);  Li G(李光);  Xia Y(夏原);  Li, G (reprint author), Chinese Acad Sci, Inst Mech, 15 Beisihuanxi Rd, Beijing 100190, Peoples R China.
浏览  |  Adobe PDF(1050Kb)  |  收藏  |  浏览/下载:448/60  |  提交时间:2018/01/16
Alloy  Peo  Aluminum  Plasma Electrolytic Oxidation  Discharge Channel  Schematic Model  Ti Tracer  
Influence of hysteresis effect on properties of reactively sputtered TiAlSiN films 会议论文
5th Asian International Conference on Heat Treatment and Surface Engineering, Hangzhou, PEOPLES R CHINA, NOV 12-14, 2016
作者:  Gao FY(高方圆);  Li G(李光);  Xia Y(夏原);  Xia, Y (reprint author), Chinese Acad Sci, Inst Mech, 15 Beisihuanxi Rd, Beijing 100190, Peoples R China.
浏览  |  Adobe PDF(1195Kb)  |  收藏  |  浏览/下载:343/87  |  提交时间:2018/01/16
Thin-films  Mechanical-properties  Coatings  Microstructure  Oxidation  Evolution  Al  Si  
Characterization of Cr doped diamond-like carbon films and research on mechanical properties 会议论文
International Conference on Materials Science and Nanotechnology (ICMSN 2012), Guangzhou, PEOPLES R CHINA, NOV 16-18, 2012
作者:  Fan YY(范有余);  Li G(李光);  Xia Y(夏原);  Fan, YY (reprint author), Chinese Acad Sci, Inst Mech, Beijing 100190, Peoples R China.
浏览  |  Adobe PDF(979Kb)  |  收藏  |  浏览/下载:768/152  |  提交时间:2013/02/26
Cr-dlc Films  Internal Stress  Nanohardness  x Ray Photoelectron Spectroscopy  
Transient voltage-current characteristics: New insights into plasma electrolytic oxidation process of aluminium alloy 期刊论文
INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2012, 卷号: 7, 期号: 8, 页码: 7619-7630
作者:  Duan HP(段红平);  Li YC;  Xia Y(夏原);  Chen SH(陈少华);  Duan, HP;  Chinese Acad Sci, Inst Mech, 15 Beisihuanxi Rd, Beijing 100190, Peoples R China.
Adobe PDF(540Kb)  |  收藏  |  浏览/下载:891/277  |  提交时间:2013/01/18
Plasma Electrolytic Oxidation  Aluminium  Transient V-i Characteristics  Semiconducting Properties  Schottky Barrier Diode  Semiconductor Properties  Valve Metals  Coatings  Films  Electrodes  Growth  Az91d  
Investigation of the discharge mechanism of plasma electrolytic oxidation using Ti tracer 期刊论文
SURFACE & COATINGS TECHNOLOGY, 2012, 卷号: 206, 期号: 21, 页码: 4462-4465
作者:  Liu XJ(刘晓静);  Li G(李光);  Xia Y(夏原);  Li, G;  Chinese Acad Sci, Inst Mech, Beijing 100190, Peoples R China.
Adobe PDF(710Kb)  |  收藏  |  浏览/下载:1074/341  |  提交时间:2013/01/18
Plasma Electrolytic Oxidation  Ti Tracer  Discharge Mechanism  Coatings' Growth  Anodic-oxidation  Coatings