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Impact resistance and energy dissipation mechanism of nanocrystalline CoCrNi medium entropy alloy nanofilm under supersonic micro-ballistic impact 期刊论文
INTERNATIONAL JOURNAL OF PLASTICITY, 2023, 卷号: 171, 页码: 11
作者:  Dong, J. L.;  Li, F. . C.;  Gu, Z. . P.;  Jiang, M. Q.;  Liu, Y. . H.;  Wang, G. J.;  Wu, X. Q.
Adobe PDF(7962Kb)  |  收藏  |  浏览/下载：55/2  |  提交时间：2024/01/08
Medium entropy alloy nanofilm  Impact resistance  Solid-state amorphization  Energy dissipation mechanism  
Impact resistance of single-layer metallic glass nanofilms to high-velocity micro-particle penetration 期刊论文
EXTREME MECHANICS LETTERS, 2021, 卷号: 44, 页码: 6
作者:  Dong JL(董金磊);  Song X(宋鑫);  Wang, Z. J.;  Xiao KL(肖凯璐);  Liu, Y. H.;  Wilde, G.;  Wu XQ(吴先前);  蒋敏强2,4)
Adobe PDF(2174Kb)  |  收藏  |  浏览/下载：382/65  |  提交时间：2021/05/31
Metallic glass nanofilm  High-velocity impact  Penetration  Impact resistance  
Metallic glass nanofilms 期刊论文
Journal of Non-Crystalline Solids, 2011, 卷号: 357, 期号: 7, 页码: 1621-1627
作者:  Jiang MQ(蒋敏强);  Duan GH(段桂花);  Dai LH(戴兰宏)
Adobe PDF(2425Kb)  |  收藏  |  浏览/下载：879/214  |  提交时间：2011/04/18
Metallic Glass  Nanofilm  Structural Stability  Electron-transparency  Shear Bands  
Rotating compensator sampling for spectroscopic imaging ellipsometry 期刊论文
Thin Solid Films, 2011, 卷号: 519, 期号: 9, 页码: 2742-2745
作者:  Meng YH(孟永宏);  Jin G(靳刚);  Jin, G (reprint author), Chinese Acad Sci, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China
Adobe PDF(328Kb)  |  收藏  |  浏览/下载：618/174  |  提交时间：2012/04/01
Rotating Compensator  Spectroscopic Imaging Ellipsometry  Spectroscopic Ellipsometry  Imaging Ellipsometry  Ellipsometry  Nanofilm Pattern  Microellipsometry  Design  Layers  
Rotating compensator sampling for spectroscopic imaging ellipsometry 会议论文
5th International Conference on Spectroscopic Ellipsometry, Albany, NY, MAY 23-29, 2010
作者:  Meng YH(孟永宏);  Jin G(靳刚);  Jin, G (reprint author), Chinese Acad Sci, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China
Adobe PDF(328Kb)  |  收藏  |  浏览/下载：1037/288  |  提交时间：2012/04/01
Rotating Compensator  Spectroscopic Imaging Ellipsometry  Spectroscopic Ellipsometry  Imaging Ellipsometry  Ellipsometry  Nanofilm Pattern  
Size-Dependent Elastic Modulus And Fracture Toughness Of The Nanofilm With Surface Effects 期刊论文
Surface Review And Letters, 2008, 页码: 599-603
作者:  Guo JG(郭建刚);  Zhou LJ;  Zhao YP(赵亚溥);  Zhao, YP (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China.
Adobe PDF(158Kb)  |  收藏  |  浏览/下载：729/181  |  提交时间：2009/08/03
Size-dependent  Surface Effects  Elastic Modulus  Fracture Toughness  Nanofilm  Youngs Modulus  Films