IMECH-IR  > 力学所知识产出(1956-2008)
Hysteresis effect in adhesive elastic contact
Wei Z(魏征); Zhao YP(赵亚溥)
Source PublicationProceedings of the ASME Design Engineering Technical Conference
2003
Conference Name2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference
Conference DateSeptember 2, 2003 - September 6, 2003
Conference PlaceChicago, IL, United states
AbstractAdhesive forces in microscale or nanoscale contact play a significant role in microelectromechanical systems (MEMS); scanning probe microscope (SPM) and some other related fields. In this paper, the relationship between the pull-off force and the transition parameter as well as the variation of the pull-off radius with the transition parameter is given. When hysteresis effect is considered, hysteresis models are presented to describe the contact radius as a function of external load in loading and unloading processes. Among these models, we verified the hysteresis model from JKR, which is in a good agreement with experiment. The parameter α of dissipated elastic energy can be measured through experiment.
KeywordScanning Probe Microscope (Spm) Transition Parameter
Indexed ByEI
Language英语
Document Type会议论文
Identifierhttp://dspace.imech.ac.cn/handle/311007/60268
Collection力学所知识产出(1956-2008)
Recommended Citation
GB/T 7714
Wei Z,Zhao YP. Hysteresis effect in adhesive elastic contact[C],2003.
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