Knowledge Management System of Institue of Mechanics, CAS
| Hysteresis effect in adhesive elastic contact | |
Wei Z(魏征); Zhao YP(赵亚溥)
| |
| Source Publication | Proceedings of the ASME Design Engineering Technical Conference |
| 2003 | |
| Conference Name | 2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference |
| Conference Date | September 2, 2003 - September 6, 2003 |
| Conference Place | Chicago, IL, United states |
| Abstract | Adhesive forces in microscale or nanoscale contact play a significant role in microelectromechanical systems (MEMS); scanning probe microscope (SPM) and some other related fields. In this paper, the relationship between the pull-off force and the transition parameter as well as the variation of the pull-off radius with the transition parameter is given. When hysteresis effect is considered, hysteresis models are presented to describe the contact radius as a function of external load in loading and unloading processes. Among these models, we verified the hysteresis model from JKR, which is in a good agreement with experiment. The parameter α of dissipated elastic energy can be measured through experiment. |
| Keyword | Scanning Probe Microscope (Spm) Transition Parameter |
| Indexed By | EI |
| Language | 英语 |
| Document Type | 会议论文 |
| Identifier | http://dspace.imech.ac.cn/handle/311007/60268 |
| Collection | 力学所知识产出(1956-2008) |
| Recommended Citation GB/T 7714 | Wei Z,Zhao YP. Hysteresis effect in adhesive elastic contact[C],2003. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| CaEi027.pdf（349KB） | 会议论文 | 开放获取 | CC BY-NC-SA | View Application Full Text | ||
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