×
验证码:
换一张
Forgotten Password?
Stay signed in
China Science and Technology Network Pass Registration
×
China Science and Technology Network Pass Registration
Log In
Chinese
|
English
中国科学院力学研究所机构知识库
Knowledge Management System of Institue of Mechanics, CAS
Log In
Register
ALL
ORCID
Title
Creator
Thesis Advisor
Keyword
Document Type
Source Publication
Publisher
Date Issued
Date Accessioned
Indexed By
Funding Project
DOI
Study Hall
Image search
Paste the image URL
Home
Collections
Authors
DocType
Subjects
K-Map
News
Search in the results
Collection
力学所知识产出(19... [1]
Creator
Chen JA [1]
Ding GF [1]
Wang L [1]
Wang MJ [1]
Yang CS [1]
Zhang YM [1]
More...
Document Type
Journal ar... [1]
Date Issued
2004 [1]
Language
英语 [1]
Source Publication
Acta Metal... [1]
Indexed By
EI [1]
Funding Project
Funding Organization
Thesis Advisor
×
Knowledge Map
IMECH-IR
Start a Submission
Submissions
Unclaimed
Claimed
Attach Fulltext
Bookmarks
QQ
Weibo
Feedback
Browse/Search Results:
1-1 of 1
Help
Filters
Indexed By：EI
Creator：张泰华
First author
Date Issued：2004
Community：力学所知识产出(1956-2008)
First author affiliation
The first author
Corresponding Author
Selected(
0
)
Clear
Items/Page:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort:
Select
Author Ascending
Author Descending
Title Ascending
Title Descending
Issue Date Ascending
Issue Date Descending
WOS Cited Times Ascending
WOS Cited Times Descending
Submit date Ascending
Submit date Descending
Journal Impact Factor Ascending
Journal Impact Factor Descending
Microbridge testing of Young's modulus and residual stress of nickel film electroplated on silicon wafer
期刊论文
Acta Metallurgica Sinica(English Letters), 2004, 卷号: 17, 期号: 3, 页码: 247-254
Authors:
Zhou Y
;
Yang CS
;
Chen JA
;
Ding GF
;
Wang L
;
Wang MJ
;
Zhang YM
;
Zhang TH(张泰华)
View
|
Adobe PDF(475Kb)
|
Favorite
|
View/Download：183/46
|
Submit date：2015/09/14
Nickel Film Microbridge
Mems
Mechanical Property
Loadeflection Measurement
