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Cryogenic temperature toughening and strengthening due to gradient phase structure 期刊论文
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2018, 卷号: 712, 页码: 358-364
Authors:  Ma ZW;  Ren Y;  Li RG;  Wang YD;  Zhou LL;  Wu XL(武晓雷);  Wei YJ(魏宇杰);  Gao HJ(高华健)
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Cryogenic  Toughening  Strengthening  Gradient  Synchrotron high-energy X-ray diffraction  
In situ synchrotron high-energy X-ray diffraction study of microscopic deformation behavior of a hard-soft dual phase composite containing phase transforming matrix 期刊论文
ACTA MATERIALIA, 2017, 卷号: 130, 页码: 297-309
Authors:  Zhang JS;  Hao SJ;  Jiang DQ;  Huan Y(郇勇);  Cui LS;  Liu YN;  Yang H;  Ren Y;  Liu, YO (reprint author), Univ Western Australia, Sch Mech & Chem Engn, Crawley, WA 6009, Australia.
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Composite  Mechanical Behavior  High-energy X-ray Diffraction  Martensitic Transformation  Tini  
Size- And Temperature-Dependent Thermal Expansion Coefficient Of A Nanofilm 期刊论文
Chinese Physics Letters, 2009, 卷号: 26, 期号: 6, 页码: 066201
Authors:  Zhou LJ;  Guo JG(郭建刚);  Zhao YP(赵亚溥)
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Long-range Relationship  X-ray-diffraction  Thin-films  Elastic-constants  Surface  Morse  Modulus  Metals  
Growth of Silicon Carbide Bulk Crystals by Physical Vapor Transport Method and Modeling Efforts in the Process Optimization 期刊论文
Journal of Crystal Growth, 2006, 卷号: 292, 期号: 2, 页码: 197-200
Authors:  Chen QS(陈启生);  Lu J;  Zhang ZB(张自兵);  Wei GD;  Prasad V;  Chen, QS (reprint author), Chinese Acad Sci, Inst Mech, 15 Bei Si Huan Xi Rd, Beijing 100080, Peoples R China.
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Growth Models  X-ray Diffraction  Growth From Vapor  Single Crystal Growth  Silicon Carbide  
The magnetic and structure properties of room-temperature ferromagnetic semiconductor (Ga,Mn)N 期刊论文
Journal of Crystal Growth, 2004, 卷号: 262, 期号: 1-4, 页码: 287-289
Authors:  Zhang FQ(张富强);  Chen NF(陈诺夫);  Liu XL;  Liu ZK;  Yang SY;  Chai CL;  Zhang, FQ (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 100083, Peoples R China.
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X-ray Diffraction  Ion Beam depositIon  Gan/al2o3  Ferromagnetic Materials  Implanted Gan  Injection  
Ga1-xMnxSb grown on GaSb substrate by liquid phase epitaxy 期刊论文
Journal of Crystal Growth, 2004, 卷号: 260, 期号: 1-2, 页码: 50-53
Authors:  Chen CL;  Chen NF(陈诺夫);  Liu LF;  Li YL;  Wu JL;  Chen, CL (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 100083, Peoples R China.
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X-ray Diffraction  Liquid Phase Epitaxy  Semiconducting Ternary Compounds  
FexSi grown with mass-analyzed low-energy dual ion beam deposition 期刊论文
Journal of Crystal Growth, 2004, 卷号: 263, 期号: 1-4, 页码: 143-147
Authors:  Liu LF;  Chen NF(陈诺夫);  Zhang FQ(张富强);  Chen CL;  Li YL;  Yang SY;  Liu Z;  Liu, LF (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China.
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Auger Electron Spectroscopy  X-ray Diffraction  Ion Beam depositIon  Semiconducting Silicon  Doped Si-mn  Spin-photonics  Thin-films  Silicon  Gas  
Mn implanted GaAs by low energy ion beam deposition 期刊论文
Journal of Crystal Growth, 2004, 卷号: 264, 期号: 1-3, 页码: 31-35
Authors:  Song SL;  Chen NF(陈诺夫);  Zhou JP;  Yin ZG;  Li YL;  Yang SY;  Liu ZK;  Song, SL (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China.
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X-ray Diffraction  Ion Beam Deposit  Magnetic Materials  Semiconducting Gallium Arsenide  Curie-temperature  Semiconductors  Ferromagnetism  System  Mn)As  (Ga  Gan  
(Ga, Gd, As) film growth on GaAs substrate by low-energy ion-beam deposit 期刊论文
Journal of Crystal Growth, 2004, 卷号: 260, 期号: 3-4, 页码: 451-455
Authors:  Song SL;  Chen NF(陈诺夫);  Zhou JP;  Li YL;  Chai CL;  Yang SY;  Liu ZK;  Song, SL (reprint author), Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China.
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Auger Electron Spectroscopy  X-ray Diffraction  Ion-beam Epitaxy  Gadolinium Compounds  Metal-insulator-transition  Epitaxy  
(Ga,Mn,As) compounds grown on semi-insulating GaAs with mass-analyzed low energy dual ion beam deposition 期刊论文
Journal of Crystal Growth, 2002, 卷号: 234, 期号: 2-3, 页码: 359-363
Authors:  Yang JL;  Chen NF(陈诺夫);  Liu ZK;  Yang SY;  Chai CL;  Liao MY;  He HJ
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X-ray Diffraction